Kiwa PVEL’s approach to testing and benchmarking PV module reliability has been our key focus for more than a decade. The PQP results enable data-driven solar procurement and investments for developers, financiers, and asset owners. Learn more about our testing methodology and why PQP testing matters here.
Kiwa PVEL’s PQP and Scorecards help manufacturers reach new buyers and demonstrate the quality of their products. Ready for your company’s PV modules to appear in Kiwa PVEL’s next Scorecard? Contact us to sign up for testing.
Kiwa PVEL’s Thermal Cycling (TC) test assesses a PV module’s ability to endure changes in temperature.
The Damp Heat (DH) test simulates long-term exposure to high temperatures and high humidity conditions.
The Mechanical Stress Sequence (MSS) tests the mechanical durability of the PV module’s glass, frames and cells.
The Hail Stress Sequence (HSS) subjects PV modules to extreme hail impacts and tests for subsequent power loss.
Potential-induced degradation (PID) tests for power loss that can occur at high voltages between the cells and PV module frames.
Light-induced degradation (LID) and light-and-elevated temperature-induced degradation (LETID) testing quantifies PV module susceptibility to these early-life power loss mechanisms.
Ultraviolet light-induced degradation (UVID) testing reveals how stable the PV module is under UV irradiation.
The Backsheet Durability Sequence (BDS) assesses vital reliability risks for PV module backsheets including yellowing and polymer cracking.
PAN and IAM testing measures PV module performance at different temperature, irradiance and light angle conditions.
The Field Exposure (FE) test provides an indication of real-world module performance over one year of outdoor conditions.
Now available, the 10th Edition of Kiwa PVEL’s PV Module Reliability Scorecard features Top Performers from the industry’s best manufacturers and is the essential resource for PV module reliability and performance insights
